Electron Mobility Model for 〈110〉 Stressed Si Including Strain-Dependent Mass

نویسندگان

  • S. Dhar
  • S. Selberherr
چکیده

Stress induced enhancement of electron mobility has primarily been attributed to the splitting of the conduction bands. However, experiments [1] have indicated that the mobility enhancement cannot solely be attributed to this effect, and a recent study has shown that a stress along the 〈110〉 direction leads to a change of the effective mass [2]. This work investigates the effect of the variation of the effective mass with stress along 〈110〉 direction on the electron mobility. An improved low-field mobility model incorporating the effective mass change is presented.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Mobility Enhancement in Indium-rich N-channel InxGa1-xAs HEMTs by Application of <110> Uniaxial Strain

As in Si CMOS, the incorporation of mechanical strain offers the possibility of improving the performance of III-V field effect transistors (FETs). Quantifying its potential and providing fundamental understanding of the impact of strain are the goals of this study. This paper reports an investigation of the impact of <110> uniaxial strain on n-type InAlAs/InGaAs HEMTs with a 70% InAs channel c...

متن کامل

High Transport Si/SiGe Heterostructures for CMOS Transistors with Orientation and Strain Enhanced Mobility

We have demonstrated high mobility MOS transistors on high quality epitaxial SiGe films selectively grown on Si (100) substrates. The hole mobility enhancement afforded intrinsically by the SiGe channel (60%) is further increased by an optimized Si cap (40%) process, resulting in a combined ∼100% enhancement over Si channels. Surface orientation, channel direction, and uniaxial strain technolog...

متن کامل

Physical Modeling of Electron Mobility Enhancement for Arbitrarily Strained Silicon

The band structure (BS) of Si with arbitrary stress/strain conditions has been calculated using the empirical non-local pseudopotential method (EPM). It is shown that the change of the effective masses cannot be neglected for general stress conditions and how this effect together with the strain induced splitting of the conduction bands can be used to optimize electron mobility enhancement Δμn....

متن کامل

Strain-Induced, Off-Diagonal, Same-Atom Parameters in Empirical Tight-Binding Theory Suitable for [110] Uniaxial Strain Applied to a Silicon Parametrization

State-of-the-art transistors achieve their improved performance through strain engineering. The somewhat unusual uniaxial ͓110͔ strain is of particular importance as it provides a significant mobility increase for electrons. Empirical tight binding has shown tremendous benefits in modeling realistically large structures including standard strain conditions, but often fails to predict the correct ...

متن کامل

Comparative Analysis of Pseudo-Potential and Tight-Binding Band Structure Calculations with an Analytical Two-Band k·p Model: Conduction Band of Silicon

The k·p theory allows to describe the band structure analytically. After the pioneering work by Luttinger and Kohn [1] the six-band k·p method has become widely used to model the valence band in silicon. The conduction band in silicon is usually approximated by three pairs of equivalent minima located near the Xpoints of the Brillouin zone. It is commonly assumed that close to the minima the el...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2006